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World Journal of Engineering Research and Technology

( An ISO 9001:2015 Certified International Journal )

An International Peer Reviewed Journal for Engineering Research and Technology

An Official Publication of Society for Advance Healthcare Research (Reg. No. : 01/01/01/31674/16)

ISSN 2454-695X

Impact Factor : 7.029

ICV : 79.45

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    Article are invited for publication in WJERT Coming Issue

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    WJERT Rank with Index Copernicus Value 79.45 due to high reputation at International Level

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Indexing

Abstract

FUNCTIONAL BROADSIDE TESTS USING A FIXED HARDWARE STRUCTURE WITH LFSR

D.Anjaneyulu*, D.Prasanth Varma and G.Rama Rao

ABSTRACT

Functional broadside tests are two-pattern scan based tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. In addition, the power dissipation during the fast functional clock cycles of functional broadside tests does not exceed that possible during functional operation. On-chip test generation has the added advantage that it reduces test data volume and facilitates at-speed test application. This paper shows that on-chip generation of functional broadside tests can be done using a simple and fixed hardware structure, with a small number of parameters that need to be tailored to a given circuit, and can achieve high transition fault coverage for testable circuits. With the proposed on-chip test generation method, the circuit is used for generating reachable states during test application. This alleviates the need to compute reachable states offline.

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