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World Journal of Engineering
Research and Technology

( An ISO 9001:2015 Certified International Journal )

An International Peer Reviewed Journal for Engineering Research and Technology

ISSN 2454-695X

Impact Factor : 5.924

ICV : 79.45

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Abstract

ALTERCATIONS IN PHYSICOCHEMICAL PROPERTIES OF SOFT CHEMICAL ROUTE SYNTHESIZED ZNO THIN FILM

Jayesh R. Pawar, Munjaji E. Dudhmal, Rajesh A. Joshi*

ABSTRACT

The Zinc Oxide (ZnO) thin films were deposited onto the glass substrates by a successive ionic layer adsorption and reaction method, which is based on the alternate dipping of substrate in a zinc nitrate solution complexes with NH4OH and distilled water. These as deposited ZnO thin films are annealed at 100, 200, 300 and 400 °C respectively. the effect of annealing studied as a function of X-ray diffraction pattern, Raman spectrum, while surface morphology and compositional analysis studied using scanning electron microscopy (SEM) and energy dispersive X-ray absorption spectra (EDAX) respectively. The X-ray diffraction (XRD) pattern shows wrurtzite structure with c axis orientation. The Raman active zone-center optical phonons predicted by the group theory are A1 + 2E2 + E1. SEM images shows modifications in surface morphology upon annealing treatments while the exact composition as observed as expected and used for ZnO synthesis, optical absorption spectra shows two peaks at 300 and 375nm corresponding for phonon exciton formation and transitions.

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