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World Journal of Engineering
Research and Technology

An International Peer Reviewed Journal for Engineering Research and Technology

ISSN 2454-695X

Impact Factor : 4.326

ICV : 79.45

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Abstract

A NOVEL APPROACH FOR DIAGNOSIS OF FAULTS IN ANALOG VLSI CIRCUITS BY THE APPLICATION OF DISCRETE METHOD

Baldev Raj* G. M. Bhat

ABSTRACT

Analog circuit testing is one of difficult task, due mainly the lack of fault models and accessibility to internal nodes. An approach is presented for analog circuit modeling and testing to overcome this problem In this paper we proposed a method to detect faults in analog VLSI circuits using discrete method. The area of fault modelling in analog VLSI circuit does not achieve the same degree as compare to digital fault model. So there is need of simple analog fault model which works effectively. As we need more application on one chip the circuitry of analog VLSI circuit becomes more complicated so it is very difficult to analyses fault in that circuit. In this method we use discretization technique and also apply bilinear transformation. Our method is simple and not time consuming as compare to other methods. The all simulation and algorithm are made with the help of MATLAB/Simulink.

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